Michael T. Postek

6 books • 1 series

Nov 15, 2012
Cover of Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI

Jul 15, 2012
Cover of Scanning Microscopies 2012

Scanning Microscopies 2012 (The International Society for Optical Engineering Proceedings of SPIE, #8378)

Dec 1, 2011
Cover of Scanning Microscopies 2011

Scanning Microscopies 2011

Jan 1, 2011
Cover of Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V

Jan 1, 2010
Cover of Instrumentation, Metrology, and Standards for Nanomanufacturing IV

Instrumentation, Metrology, and Standards for Nanomanufacturing IV

Jan 1, 2010
Cover of Scanning Microscopy 2010

Scanning Microscopy 2010