Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences ; 24-26 April 2012, Baltimore, Maryland, United States (The International Society for Optical Engineering Proceedings of SPIE, #8378)

by Michael T. Postek, Dale E. Newbury, and S. Frank Platek

• ISBN10: 0819490563
• ISBN13: 9780819490568
• Publish Date: 15 July 2012
• Publish Status: Unknown
• Out of Print: 11 May 2017
• Publish Country: US
• Imprint: SPIE Press
• Format: Paperback
• Language: English