Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V: 24-25 August 2011, San Diego, California, United States

by Michael T. Postek

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  • ISBN10 0819487155
  • ISBN13 9780819487155
  • Publish Date 1 January 2011
  • Publish Status Active
  • Out of Print 11 May 2017
  • Publish Country US
  • Imprint SPIE Press
  • Format Paperback
  • Pages 132
  • Language English