Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI: 13-14 August 2012, San Diego, California, United States

by Michael T. Postek

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  • ISBN10 0819491837
  • ISBN13 9780819491831
  • Publish Date 15 November 2012
  • Publish Status Unknown
  • Out of Print 11 May 2017
  • Publish Country US
  • Imprint SPIE Press
  • Format Paperback
  • Language English