Instrumentation, Metrology, and Standards for Nanomanufacturing IV: 2-4 August 2010, San Diego, California, United States

by Michael T. Postek

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  • ISBN10 0819482633
  • ISBN13 9780819482631
  • Publish Date 1 January 2010
  • Publish Status Active
  • Out of Print 11 May 2017
  • Publish Country US
  • Imprint SPIE Press
  • Pages 178
  • Language English