Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality, and many factors have contributed to their industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market-place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex, and demand components of the highest possible quality. Testing in general, and defect-oriented testing in particular, help in realizing these objectives. Providing a detailed overview of the subject, this book is intended for design and test professionals as well as researchers and students working in the field.
- ISBN10 1475749279
- ISBN13 9781475749274
- Publish Date 15 January 2014 (first published 31 December 1997)
- Publish Status Withdrawn
- Out of Print 18 October 2014
- Publish Country US
- Imprint Springer
- Format Paperback (US Trade)
- Pages 324
- Language English