Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, #10)

by Otwin Breitenstein, Wilhelm Warta, and Martin Langenkamp

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Book cover for Lock-in Thermography

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This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
  • ISBN13 9783642264788
  • Publish Date 6 November 2012 (first published 28 May 2003)
  • Publish Status Out of Print
  • Out of Print 15 June 2021
  • Publish Country DE
  • Publisher Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
  • Imprint Springer-Verlag Berlin and Heidelberg GmbH & Co. K
  • Edition Softcover reprint of hardcover 2nd ed. 2010
  • Format Paperback
  • Pages 258
  • Language English