Jose Pineda de Gyvez | Bookhype

Sep 1, 2014

Cover of Integrated Circuit Defect-Sensitivity

Integrated Circuit Defect-Sensitivity

Nov 5, 2010

Cover of Low-Power High-Resolution Analog to Digital Converters

Low-Power High-Resolution Analog to Digital Converters (Analog Circuits and Signal Processing)

Jan 1, 2007

Cover of Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, #34)

Dec 31, 1992

Cover of Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Integrated Circuit Defect-Sensitivity: Theory and Computational Models (The Springer International Series in Engineering and Computer Science, #208)