Integrated Circuit Defect-Sensitivity: Theory and Computational Models

by Jose Pineda de Gyvez

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  • ISBN10 1461531594
  • ISBN13 9781461531593
  • Publish Date 1 September 2014
  • Publish Status Withdrawn
  • Out of Print 18 October 2014
  • Publish Country US
  • Imprint Springer
  • Format Paperback (US Trade)
  • Pages 196
  • Language English