Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (Advances in Imaging and Electron Physics, #191) (Advances in Electronics & Electron Physics S., Vol 92)

Peter W. Hawkes and Peter Hawkes

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Book cover for Advances in Imaging and Electron Physics

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
  • ISBN13 9780123813145
  • Publish Date 14 September 2010 (first published 29 December 1994)
  • Publish Status Active
  • Publish Country US
  • Publisher Elsevier Science Publishing Co Inc
  • Imprint Academic Press Inc
  • Format Hardcover
  • Pages 248
  • Language English