Proceedings of SPIE
2 total works
v. 4398
Optical Measurement Systems for Industrial Inspection II
by Wolfgang Osten, Werner Jueptner, and Malgorzata Kujawinska
Published 1 October 2001
v. 4400
Microsystems Engineering
by Christophe Gorecki, Werner Jueptner, and Malgorzata Kujawinska
Published 1 October 2001