Springer Series in Advanced Microelectronics
1 primary work
Book 10
Lock-in Thermography
by Otwin Breitenstein, Wilhelm Warta, and Martin Langenkamp
Published 28 May 2003
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.