Electron back scatter diffraction (EBSD) is an immensely powerful method of characterizing microstructure. The technique is used in many scanning electron microscopes to examine the structure, pattern, and orientation of samples and is an important tool in materials science, physics, and earth science labs. This up-to-date, comprehensive introduction covers the theory of EBSD, pattern formation, recording EBSD patterns, calibration, and orientation measurement.
- ISBN10 0387916210
- ISBN13 9780387916217
- Publish Date 1 April 2001
- Publish Status Out of Print
- Out of Print 14 April 2021
- Publish Country US
- Imprint Springer-Verlag New York Inc.
- Format Paperback
- Pages 160
- Language English