Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
- ISBN13 9781441935748
- Publish Date 29 October 2010 (first published 19 November 2004)
- Publish Status Active
- Publish Country US
- Imprint Springer-Verlag New York Inc.
- Edition Softcover reprint of hardcover 1st ed. 2005
- Format Paperback
- Pages 357
- Language English