Gate Dielectrics and Mos Ulsis (Springer Series in Electronics and Photonics, #34)

by Takashi Hori

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Gate Dielectrics focusses on dielectric films satisfying the superior quality gate dielectric even in large-scale integration. The information presented is rather up to date with regard to nanometer-range ultrathin gate-dielectric films, which are indispensible for submicrometer ULSIs.
  • ISBN10 3642608574
  • ISBN13 9783642608575
  • Publish Date 28 October 1997
  • Publish Status Withdrawn
  • Out of Print 18 October 2014
  • Publish Country US
  • Imprint Springer My Copy UK
  • Format Paperback (US Trade)
  • Pages 372
  • Language English