Secondary Ion Mass Spectrometry: International Conference on Secondary Ion Mass Spectrometry

A. Benninghoven (Editor), C.A. Evans (Editor), K.D. McKeegan (Editor), H.A. Storms (Editor), and H. W. Werner (Editor)

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Book cover for Secondary Ion Mass Spectrometry

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These are the proceedings of the SIMS VII, which was the seventh in a series of conferences held biennially. It was dedicated to the memory of Donald E. Harrison, Jr and his pioneering research in the mechanisms of ion beam sputtering and in the use of molecular dynamics simulations for the study of ion bombardment of solids. Other than the Harrison memorial papers, speakers at the conference covered three other major areas. These were: organic and biological analyses; enhancement techniques; and the contribution of SIMS to the semiconductor industry.
  • ISBN10 0471927384
  • ISBN13 9780471927389
  • Publish Date 30 April 1990 (first published 25 May 1988)
  • Publish Status Out of Print
  • Out of Print 11 September 1992
  • Publish Country GB
  • Publisher John Wiley and Sons Ltd
  • Imprint John Wiley & Sons Ltd
  • Format Hardcover
  • Pages 992
  • Language English