Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)

by Nicola Nicolici and Bashir M. Al-Hashimi

0 ratings • 0 reviews • 0 shelved
Book cover for Power-Constrained Testing of VLSI Circuits
Shelve It

Bookhype may earn a small commission from qualifying purchases. Full disclosure.

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

  • ISBN13 9781402072352
  • Publish Date 28 February 2003
  • Publish Status Active
  • Publish Country US
  • Imprint Springer-Verlag New York Inc.
  • Edition 2003 ed.
  • Format Hardcover
  • Pages 178
  • Language English