Hot-Carrier Effects in Mos Devices

by Eiji Takeda, Cary Y Yang, and Akemi Miura-Hamada

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The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. They are rapidly movingout of the research lab and into the real world.

This book is derived from Dr. Takedas book in Japanese, Hot-Carrier Effects, (published in 1987 by Nikkei Business Publishers). However, the new book is much more than a translation. Takedas original work was a starting point for developing this much more complete and fundamental text on this increasingly important topic. The new work encompasses not only all the latest research and discoveries made in the fast-paced area of hot carriers, but also includes the basics of MOS devices, and the practical considerations related to hot carriers.
  • ISBN10 0080926223
  • ISBN13 9780080926223
  • Publish Date 1 November 1995 (first published 1 January 1995)
  • Publish Status Active
  • Publish Country US
  • Imprint Academic Press
  • Format eBook
  • Language English