Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means meeting the user's needs at a minimum cost. The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.
- ISBN10 1280206098
- ISBN13 9781280206092
- Publish Date 1 January 2000
- Publish Status Active
- Out of Print 4 March 2015
- Publish Country US
- Imprint Springer
- Pages 690
- Language English