Vishwani D Agrawal | Bookhype

Jan 1, 2000

Cover of Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing, #17)

Dec 31, 1993

Cover of Concurrent and Comparative Discrete Event Simulation

Concurrent and Comparative Discrete Event Simulation

Jun 30, 1989

Cover of Unified Methods for VLSI Simulation and Test Generation

Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, #73)

Jul 31, 1988

Cover of Test Generation for Very Large Scale Integration Chips

Test Generation for Very Large Scale Integration Chips