Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing, #30)

by Prithviraj Kabisatpathy, Alok Barua, and Satyabroto Sinha

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Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.

Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .

Also contains problems that can be used as quiz or homework.

  • ISBN10 0387257438
  • ISBN13 9780387257433
  • Publish Date 1 January 2005
  • Publish Status Active
  • Publish Country US
  • Imprint Springer-Verlag New York Inc.
  • Format eBook
  • Language English