Frontiers in Electronic Testing
1 primary work
Book 30
Fault Diagnosis of Analog Integrated Circuits
by Prithviraj Kabisatpathy, Alok Barua, and Satyabroto Sinha
Published 1 January 2005
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits.
Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces .
Also contains problems that can be used as quiz or homework.