Test Generation for Very Large Scale Integration Chips

by Vishwani D Agrawal and S.C. Seth

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Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial.
  • ISBN10 081868786X
  • ISBN13 9780818687860
  • Publish Date 31 July 1988
  • Publish Status Out of Print
  • Out of Print 2 October 2008
  • Publish Country US
  • Imprint IEEE Computer Society Press,U.S.
  • Format Hardcover
  • Pages 400
  • Language English