Proceedings of SPIE

2 total works

Analytical and Diagnostic Technicques for Semiconductor Materials, Devices and Processes

by Bernd O. Kolbesen, C. Claeys, Peter Stallhofer, and etc.

Published 31 May 2003

Third International Conference on Experimental Mechanics

by Xiaoping Wu and etc.

Published 3 July 2002

This volume contains the proceedings of the Third International Conference on Experimental Mechanics.