Materials Characterization

1 total work

Characterization of Organic Thin Films

by Abraham Ulman

Published 30 September 1994

Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering. This volume in the Materials Characterization series introduces the major common types of analysis used in characterizing of thin films and the various appropriate characterization technologies for each. Materials such as Langmuir-Blodgett films and self-assembled monolayers are first introduced, followed by analysis of surface properties and the various characterization technologies used for such. Readers will find detailed information on:

• Various spectroscopic approaches to characterization of organic thin films, including infrared spectroscopy and Raman spectroscopy
• X-Ray diffraction techniques, High Resolution EELS studies, and X-Ray Photoelectron Spectroscopy
• Concise Summaries of major characterization technologies for organic thin films, including Auger Electron Spectroscopy, Dynamic Secondary Ion Mass Spectrometry, and Transmission Electron Microscopy (TEM)