A study of defect based testing, containing papers from an IEEE workshop held in 2000. Areas addressed include: deep sub-micron IDDQ testing; defect oriented testing; current measurement and yield; and current and voltage test techniques.
- ISBN10 0769506372
- ISBN13 9780769506371
- Publish Date 1 May 2000
- Publish Status Unknown
- Publish Country US
- Imprint I.E.E.E.Press
- Edition 2000 ed.
- Format Paperback
- Pages 85
- Language English