International Symposium on Defect and Fault-tolerance in VLSI Systems (DFT 2001)

by IEEE Computer Society

0 ratings • 0 reviews • 0 shelved
Book cover for International Symposium on Defect and Fault-tolerance in VLSI Systems (DFT 2001)
Shelve It

Bookhype may earn a small commission from qualifying purchases. Full disclosure.

  • ISBN10 0769512038
  • ISBN13 9780769512037
  • Publish Date 30 September 2001
  • Publish Status Active
  • Publish Country US
  • Imprint I.E.E.E.Press
  • Format Paperback
  • Pages 420
  • Language English