Defect Analysis in Electron Microscopy (Science Paperbacks)

by Michael Loretto and R. E. Smallman

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Book cover for Defect Analysis in Electron Microscopy

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  • ISBN10 0412137607
  • ISBN13 9780412137600
  • Publish Date February 1976
  • Publish Status Out of Print
  • Out of Print 18 October 2003
  • Publish Country GB
  • Publisher Taylor & Francis Ltd
  • Imprint Chapman and Hall
  • Format Hardcover
  • Pages 144
  • Language English