Photometric Analysis of Traces of Metals: General Aspects (Chemical Analysis)

by E. B. Sandell and Hiroshi Onishi

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  • ISBN10 0471030945
  • ISBN13 9780471030942
  • Publish Date 1 January 1989
  • Publish Status Out of Print
  • Out of Print 10 May 2014
  • Publish Country US
  • Imprint John Wiley & Sons Inc
  • Edition 4th Revised edition
  • Format Hardcover
  • Pages 1098
  • Language English