Reliability and Degradation: Semiconductor Devices and Circuits (Wiley series in solid state devices & circuits)

by M. J. Howes and David Vernon Morgan

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  • ISBN10 0471280283
  • ISBN13 9780471280286
  • Publish Date 25 November 1981
  • Publish Status Out of Print
  • Out of Print 11 October 1991
  • Publish Country GB
  • Publisher John Wiley and Sons Ltd
  • Imprint John Wiley & Sons Ltd
  • Format Hardcover
  • Pages 456
  • Language English