This text addresses testing problems and solutions arising from the size and complexity of modern semiconductor memory chips. It includes discussion of: memory fault models; test objectives; testing algorithms; hardware approaches for minimizing test time; and reliability testing and prediction.
- ISBN10 081867797X
- ISBN13 9780818677977
- Publish Date June 1997
- Publish Status Out of Print
- Out of Print 2 October 2009
- Publish Country US
- Imprint IEEE Computer Society Press,U.S.
- Format Paperback
- Pages 400
- Language English