Ninth International Symposium on Laser Metrology (Proceedings of SPIE)

by Chenggen Quan and Anand Asundi

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Book cover for Ninth International Symposium on Laser Metrology

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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
  • ISBN13 9780819473981
  • Publish Date 1 January 2008
  • Publish Status Active
  • Publish Country US
  • Imprint SPIE Press
  • Format Paperback
  • Pages 1088
  • Language English