This is a comprehensive introduction to Moire technology, the physics behind it and its applications to optics. It provides background information on the development of Moire methodology and compares moire analysis with conventional methods on wave properties (such as interferometry). The authors show that for every interferometric technique in metrology there is an analogous one in Moire technology, demonstrating that Moire analysis is a real alternative to interfermonetry and holography.
- ISBN10 0471509671
- ISBN13 9780471509677
- Publish Date 31 January 1990
- Publish Status Out of Stock
- Out of Print 12 November 2014
- Publish Country US
- Imprint John Wiley & Sons Inc
- Format Hardcover
- Pages 194
- Language English