Reliability of Rohs-Compliant 2D and 3D IC Interconnects

by Dr John H Lau

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  • ISBN10 007175380X
  • ISBN13 9780071753807
  • Publish Date 22 October 2010
  • Publish Status Active
  • Publish Country US
  • Imprint McGraw-Hill Education
  • Format eBook
  • Pages 560
  • Language English