Infrared Characterization for Microelectronics

by Wai Shing Lauthor and W S Lau

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  • ISBN10 1299615090
  • ISBN13 9781299615090
  • Publish Date 1 January 1999
  • Publish Status Active
  • Out of Print 3 June 2015
  • Publish Country US
  • Imprint World Scientific Publishing Company
  • Format eBook
  • Pages 175
  • Language English