This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.
- ISBN13 9780792378617
- Publish Date 30 June 2000 (first published 1 January 2000)
- Publish Status Active
- Publish Country NL
- Imprint Springer
- Edition 2002 ed.
- Format Hardcover
- Pages 210
- Language English