This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
- ISBN13 9781441995476
- Publish Date 22 September 2011
- Publish Status Active
- Publish Country US
- Imprint Springer-Verlag New York Inc.
- Edition 2012
- Format Paperback
- Pages 89
- Language English