Reduction of Jfet Parameter Drift in IC Operational Amplifiers Using Statistical Process Characterization (The Six Sigma Research Institute)

by Arvid C Carlson and Sam L Sundaram

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  • ISBN10 0201634295
  • ISBN13 9780201634297
  • Publish Date 28 February 1993
  • Publish Status Out of Print
  • Out of Print 7 December 2011
  • Publish Country AU
  • Imprint Pearson Education Australia
  • Format Paperback
  • Pages 24
  • Language English