ITC is a technical conference on the testing and total quality of integrated electronic circuits, and the assemblies and systems that are based on them. This is a collection of papers covering topics such as; dynamic current testing; MCM systems design; memory test; and unpowered opens.
- ISBN10 0780350928
- ISBN13 9780780350922
- Publish Date 31 January 1999
- Publish Status Active
- Publish Country US
- Imprint I.E.E.E.Press
- Format Paperback
- Pages 1100
- Language English