In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
- ISBN13 9789048184910
- Publish Date 19 October 2010 (first published 30 April 2009)
- Publish Status Active
- Publish Country NL
- Imprint Springer
- Edition Softcover reprint of hardcover 1st ed. 2009
- Format Paperback
- Pages 192
- Language English