Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, #494)

Lawrence C. Wagner (Editor)

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Book cover for Failure Analysis of Integrated Circuits

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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

  • ISBN13 9780412145612
  • Publish Date 31 January 1999
  • Publish Status Active
  • Publish Country GB
  • Publisher Taylor & Francis Ltd
  • Imprint Chapman and Hall
  • Edition 1999 ed.
  • Format Hardcover
  • Pages 255
  • Language English