Test Structure, Modeling and Characterization of CMOS-Based RF Devices

by Juin J. Liou, Rao J. Rapeta, and Waisum Wong

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Book cover for Test Structure, Modeling and Characterization of CMOS-Based RF Devices

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Due to the explosive growth in the worldwide internet economy, many researchers and engineers are now engaged in the design and manufacturing of RF electronics. This book provides readers with an authoritative, highly practical resource they can use in the design, modeling, and characterization of CMOS-based RF semiconductor devices. It considers not only the active devices, but also the passive devices frequently used in RF circuits. Plus, it offers a balanced approach, integrating test structure, measurement, and parameter extraction. Examples of SPICE circuit simulation are also provided.
  • ISBN10 0471469653
  • ISBN13 9780471469650
  • Publish Date 17 February 2004
  • Publish Status Cancelled
  • Publish Country GB
  • Publisher John Wiley and Sons Ltd
  • Imprint Wiley-Blackwell (an imprint of John Wiley & Sons Ltd)
  • Format Hardcover
  • Pages 320
  • Language English