This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces.
It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.
- ISBN10 9067640786
- ISBN13 9789067640787
- Publish Date 1 December 1987
- Publish Status Active
- Out of Print 12 March 2021
- Publish Country NL
- Publisher Brill
- Imprint VSP International Science Publishers
- Format Hardcover
- Pages 138
- Language English
- URL http://brill.com/product_id10984