This thesis transports you to a wonderful and fascinating small-scale world and tells you the origin of several new phenomena. The investigative tool is the improved discrete dislocation-based multi-scale approaches, bridging the continuum modeling and atomistic simulation. Mechanism-based theoretical models are put forward to conveniently predict the mechanical responses and defect evolution. The findings presented in this thesis yield valuable new guidelines for microdevice design, reliability analysis and defect tuning.
- ISBN13 9789811097690
- Publish Date 22 April 2018 (first published 4 November 2016)
- Publish Status Active
- Publish Country SG
- Imprint Springer Verlag, Singapore
- Edition Softcover reprint of the original 1st ed. 2017
- Format Paperback
- Pages 131
- Language English