Mitigation of Soft Errors in Nanoscale VLSI Circuits

by Nagarajan Ranganathan and Koustav Bhattacharya

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Reliability is a key concern in VLSI systems and transient/intermittent faults, often caused by soft errors, require designers to create special mitigation techniques. This book describes such techniques, spanning all levels of the design flow, to reduce systematically the vulnerability of VLSI systems to soft errors. Readers will be enabled to address soft error issues early in their design flow, allowing them to weigh the implications of dedicating more resources for soft error detection and prevention, against the correlating impact on delay, power and area.
  • ISBN10 1441993371
  • ISBN13 9781441993373
  • Publish Date 28 March 2014
  • Publish Status Cancelled
  • Out of Print 31 December 2013
  • Publish Country US
  • Imprint Springer-Verlag New York Inc.
  • Edition 2012
  • Format Hardcover
  • Pages 200
  • Language English