These papers constitute the proceedings of the IEEE VLSI Test Symposium 2000. Subjects covered include: microprocessor test/validation; low power BIST and scan; defect driven techniques; analogue test techniques; temperature and process drift issues; and more.
- ISBN10 0769506135
- ISBN13 9780769506135
- Publish Date 31 May 2000
- Publish Status Active
- Publish Country US
- Imprint I.E.E.E.Press
- Edition 2000, 18th ed.
- Format Paperback
- Pages 500
- Language English