This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
- ISBN13 9781627080743
- Publish Date 30 April 2015
- Publish Status Active
- Publish Country US
- Imprint A S M International
- Format Paperback
- Pages 500
- Language English