This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical method is more suitable for their planned application.
- ISBN10 1280288760
- ISBN13 9781280288760
- Publish Date 1 January 2003
- Publish Status Active
- Out of Print 19 November 2013
- Publish Country US
- Imprint Garland Publishing
- Format eBook
- Pages 120
- Language English