Atomic Layer Deposition: Principles, Characteristics, and Nanotechnology Applications

by Tommi Kaariainen, David Cameron, Marja-Leena Kaariainen, and Arthur Sherman

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Since the first edition was published in 2008, Atomic Layer Deposition (ALD) has emerged as a powerful, and sometimes preferred, deposition technology. The new edition of this groundbreaking monograph is the first text to review the subject of ALD comprehensively from a practical perspective. It covers ALD's application to microelectronics (MEMS) and nanotechnology; many important new and emerging applications; thermal processes for ALD growth of nanometer thick films of semiconductors, oxides, metals and nitrides; and the formation of organic and hybrid materials.
  • ISBN13 9781118747384
  • Publish Date 17 May 2013
  • Publish Status Active
  • Publish Country US
  • Imprint Wiley-Scrivener