This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.
The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
- ISBN13 9781489986306
- Publish Date 19 June 2015 (first published 9 January 2013)
- Publish Status Active
- Publish Country US
- Imprint Springer-Verlag New York Inc.
- Edition 2013 ed.
- Format Paperback
- Pages 198
- Language English